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Material Sciences and Engineering Publications
High-Resolution Imaging and Spectrometry of Materials by Frank Ernst (Editor); Manfred Rühle (Editor)
This book discusses Advanced transmission electron microscopy (TEM) techniques that have been instrumental in semiconductors, where they’ve helped understand the nature of internal interfaces between silicon and silicides. While these advanced TEM techniques were primarily in the US, the gap in Germany was bridged by Peter Haasen, who initiated a Microstructural Characterisation program at the Volkswagen Foundation from 1985 to 1997, supporting a wide range of research projects.
ISBN: 3540418180
Publication Date: 2002
Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules by
This book compares polymeric materials to traditional materials used in solar applications and provides information on tests needed for evaluation and materials selection.
High-Resolution Imaging and Spectrometry of Materials by
This book discusses Advanced transmission electron microscopy (TEM) techniques that have been instrumental in semiconductors, where they’ve helped understand the nature of internal interfaces between silicon and silicides. While these advanced TEM techniques were primarily in the US, the gap in Germany was bridged by Peter Haasen, who initiated a Microstructural Characterisation program at the Volkswagen Foundation from 1985 to 1997, supporting a wide range of research projects.